Whether for applications of : Detection, classification and localization of defects or anomalies - Event detection - Dimensional measurement - Aspect control - Character and code reading... each project has its own specificities: type of defect or process, level of precision and resolution, required conformity thresholds, imperatives related to the tool or the production environment... All these parameters need to be taken into account when drawing up the specifications, in order to be able to dimension an adapted and tailor-made response to each computer vision project.
Thus, while such an application will require parametric methods, for another, it will be necessary to train an artificial intelligence model, and for yet another, to combine several methods.
Our technology, the result of more than 10 years of R&D, embeds the best of the latest generation of algorithmic - parametric and AI (artificial intelligence) technologies. Our AX Vision and AX AI software suites combine different technologies and allow the creation and implementation of customized image processing and optical measurement applications.
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